Measuring thickness of thin metallic films with the use of laser probing technique
| dc.contributor.author | Komotskii, VA | |
| dc.contributor.author | Kuznetsov, MV | |
| dc.contributor.author | Okoth, SM | |
| dc.date.accessioned | 2018-07-25T12:29:11Z | |
| dc.date.available | 2018-07-25T12:29:11Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://repository.maseno.ac.ke/handle/123456789/674 | |
| dc.description.abstract | Proposed and practically carried out поп-contact method of measuring thickness of thin metallic films. The recommended range of the thickness measured is from 100A to 1500A. The method is based on probing by a laser beam periodic rectangular patterns, formed on a small portion of the film being studied and coated with a secondary metallic layer. КиберЛенинка: https://cyberleninka.ru/article/n/measuring-thickness-of-thin-metallic-films-with-the-use-of-laser-probing-technique | en_US |
| dc.publisher | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования «Российский университет дружбы народов» | en_US |
| dc.title | Measuring thickness of thin metallic films with the use of laser probing technique | en_US |
| dc.type | Article | en_US |
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