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Measuring thickness of thin metallic films with the use of laser probing technique

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dc.contributor.author Komotskii, VA
dc.contributor.author Kuznetsov, MV
dc.contributor.author Okoth, SM
dc.date.accessioned 2018-07-25T12:29:11Z
dc.date.available 2018-07-25T12:29:11Z
dc.date.issued 2005
dc.identifier.uri https://repository.maseno.ac.ke/handle/123456789/674
dc.description.abstract Proposed and practically carried out поп-contact method of measuring thickness of thin metallic films. The recommended range of the thickness measured is from 100A to 1500A. The method is based on probing by a laser beam periodic rectangular patterns, formed on a small portion of the film being studied and coated with a secondary metallic layer. КиберЛенинка: https://cyberleninka.ru/article/n/measuring-thickness-of-thin-metallic-films-with-the-use-of-laser-probing-technique en_US
dc.publisher Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования «Российский университет дружбы народов» en_US
dc.title Measuring thickness of thin metallic films with the use of laser probing technique en_US
dc.type Article en_US


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