Browsing Department of Computer science by Author "Kuznetsov, MV"

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    • Measuring thickness of thin metallic films with the use of laser probing technique 

      Komotskii, VA; Kuznetsov, MV; Okoth, SM (Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования «Российский университет дружбы народов», 2005)
      Proposed and practically carried out поп-contact method of measuring thickness of thin metallic films. The recommended range of the thickness measured is from 100A to 1500A. The method is based on probing by a laser beam ...